Abstract: Taking boost converter as an example, the sensitivity of DC-DC converter to single event transient was analyzed, and the influence of single event transient on loop response was studied. Based on the analysis of the sensitive nodes of the loop, an on-chip automatic detection method at the circuit and system level was proposed to obtain the single particle energy in time, and then transform it into the parameters of dynamic compensation, so as to improve the transient characteristics under different single particle energy. Based on the commercial 0.18 μm BCD process, the circuit design, layout design and physical verification of a highly reliable Boost converter were completed. The experiment results show that, when a system arranged with input voltage 2.9~4.5 V, output voltage 5.9~7.9 V and load ability 55 mA, under the action of single event transient effect, its maximum fluctuation of the output voltage does not exceed 1 mV, the suppression ability can reach more than 86.07%, and can resist LET = 100 MeV·cm²/mg single particle bombardment.