Abstract: To investigate the electromagnetic damage of plasma induced by 2A12 aluminum alloy subjected to strong shock loading to the logic chip modules, CD54ACT32 and CD74HC4075 logic chip modules which are commonly used in the aerospace control system were studied by applying two-stage light gas gun, a triple Langmuir probe and logic state test system of logic chip modules, 6 sets of experiments on the damage of the plasma induced by the 2A12 aluminum subjected to strong shock loading on the logic chip modules under the given experimental conditions have been implemented, and the variation of plasma electron temperature and density against time was obtained. Moreover, the function of electron temperature and density with time was obtained by fitting the experimental data. The results reveals that transient and perpetual damage to TTL level signal CD54ACT32 logic chip modules were detected by the plasma induced by 2A12 aluminum alloy subjected to strong shock loading under the given incidence angle of the projectile and similar impact velocities. However, only transient damage to CMOS level signal CD74HC4075 was observed, verifying that CMOS logic chip modules is superior to TTL logic chip modules in terms of anti-damage of plasma under the given experimental conditions.